FOUR-POINT PROBE

The Ossila Four-Point Probe is an easy-to-use tool for the rapid measurement of sheet resistance of thin films. Sheet resistance (also known as surface resistance or surface resistivity) is a common electrical property used to characterize thin films of conducting and semiconducting materials. It is a measure of the lateral resistance through a thin square of material, i.e. the resistance between opposite sides of a square. The key advantage of sheet resistance over other resistance measurements is that it is independent of the size of the square, enabling easy comparisons between different samples.

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