Hysitron TI 950

The proposed set of technologies represents a complex, versatile and effective nano- and micromechanical characterization tool for a wide range of possible applications of bulk materials and thin films (polymeric, metallics, composite components of MEMS/NEMS etc.)

Specification

Methods

Transducer Specifications • Load • Displacement Resolution: <1 nN Resolution: <0.02 nm Noise Floor: <30 nN Noise Floor: <0.2 nm Imaging Contact Force: ≤70 nN Drift: <0.05 nm/sec Stage Specifications • Z stage • X and Y stages Travel: 250 mm × 150 mm Travel: 50 mm Resolution: 3 nm

Hysitron's TI 950 TriboIndenter Features:

Quasistatic nanoindentation – Measure Young’s modulus, hardness, fracture toughness, and other mechanical properties via nanoindentation.
Scratch testing – Quantify scratch resistance, critical delamination forces, and friction coefficients with simultaneous normal and lateral force and displacement monitoring.
Top-down optics – High- resolution, colour CCD camera for individual structure identification and coarse test positioning.
SPM imaging – In-situ imaging using the indenter tip provides nanometer precision test positioning and surface topography information
Dual head testing capability for true nano/micro-scale connectivity
Active vibration isolation system providing environmental separation

Available modules:

nanoDMA – Investigate time-dependent properties of materials using a dynamic testing technique designed specifically for polymers and biomaterials
Modulus Mapping – Obtain quantitative maps of the storage and loss stiffness and moduli from a single SPM scan 3D OmniProbe – Provides forces up to 10 N and scratch lengths up to 150 mm for depth- sensing micro-indentation and tribological studies
nanoECR – Conductive nanoindentation system capable of providing simultaneous in-situ electrical and mechanical measurements for investigating material deformation and stress-induced transformation behaviour
Thermal control – Heating/cooling stages can be added for the investigation of mechanical properties at non-ambient temperatures
Vacuum stage – Wafer mounting system that eliminates the necessity of glueing or cutting wafers prior to testing
Long probes that allow to safely investigate the mechanical properties of samples immersed in water.

Gallery

Publications

RONOH, K.; NOVOTNÝ, J.; MRŇA, L.; KNÁPEK, A.; SOBOLA, D., 2024: Analysis of processing efficiency, surface, and bulk chemistry, and nanomechanical properties of the Monel® alloy 400 after ultrashort pulsed laser ablation. MATERIALS RESEARCH EXPRESS 11 (1), doi: 10.1088/2053-1591/ad184b (DEKTAK, MIRA-STAN, KRATOS-XPS, NANOINDENTER)

Rogl, G.; Bursikova, V.; Yubuta, K.; Murayama, H.; Sato, K.; Yamamoto, W.; Yasuhara, A.; Rogl, P., 2024: In-situ observation of temperature dependent microstructural changes in HPT-produced p-type skutterudites. JOURNAL OF ALLOYS AND COMPOUNDS 977, doi: 10.1016/j.jallcom.2024.173431 (NANOINDENTER)

Zeman, P.; Haviar, S.; Houška, J.; Thakur, D.; Bondarev, A.; Červená, M.; Medlín, R.; Čerstvý, R., 2024: Self-formation of dual-phase nanocomposite Zr–Cu–N coatings based on nanocrystalline ZrN and glassy ZrCu. MATERIALS & DESIGN 245, doi: 10.1016/j.matdes.2024.113278 (TITAN, HELIOS, NANOINDENTER)

Kuptsov, K. A.; Antonyuk, M. N.; Sheveyko, A. N.; Bondarev, A. V.; Shtansky, D. V., 2023: Influence of TiC Addition on Corrosion and Tribocorrosion Resistance of Cr2Ti-NiAl Electrospark Coatings. COATINGS 13 (2), doi: 10.3390/coatings13020469 (TITAN, HELIOS, NANOINDENTER)

Sharifahmadian, O.; Pakseresht, A.; Mirzaei, S.; Eliáš, M.; Galusek, D., 2023: Mechanically robust hydrophobic fluorine-doped diamond-like carbon film on glass substrate. DIAMOND AND RELATED MATERIALS 138, doi: 10.1016/j.diamond.2023.110252 (KRATOS-XPS, VERIOS, NANOINDENTER, RIE-FLUORINE)

Plichta, T.; Zahradnicek, R.; Cech, V., 2022: Surface topography affects the nanoindentation data. THIN SOLID FILMS 745, doi: 10.1016/j.tsf.2022.139105 (HELIOS, NANOINDENTER)

Bodner, S. C.; Hlushko, K.; Van De Vorst, L. T.G.; Meindlhumer, M.; Todt, J.; Nielsen, M. A.; Hooijmans, J. W.; Saurwalt, J. J.; Mirzaei, S.; Keckes, J., 2022: Graded Inconel-stainless steel multi-material structure by inter- and intralayer variation of metal alloys. JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY 21, p. 4846 - 4859, doi: 10.1016/j.jmrt.2022.11.064 (NANOINDENTER)

Bondarev, A. V.; Antonyuk, M. N.; Kiryukhantsev-Korneev, Ph V.; Polcar, T.; Shtansky, D. V., 2021: Insight into high temperature performance of magnetron sputtered Si-Ta-C-(N) coatings with an ion-implanted interlayer. APPLIED SURFACE SCIENCE 541, doi: 10.1016/j.apsusc.2020.148526 (VERIOS, HELIOS, KRATOS-XPS, NANOINDENTER)

SMOLIK, J.; KNOTEK, P.; SCHWARZ, J.; ČERNOŠKOVÁ, E.; KUTÁLEK, P.; KRÁLOVÁ, V.; TICHÝ, L., 2021: Laser direct writing into PbO-Ga2O3 glassy system: Parameters influencing microlenses formation. APPLIED SURFACE SCIENCE 540, p. 148368-1 - 9, doi: 10.1016/j.apsusc.2020.148368 (NANOINDENTER)

Mouralova K., Benes L., Bednar J., Zahradnicek R., Prokes T., Matousek R., Hrabec P., Fiserova Z., Otoupalik J., 2019: Using a DoE for a comprehensive analysis of the surface quality and cutting speed in WED-machined hadfield steel. JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY 33 (5), p. 2371 - 2386, doi: 10.1007/s12206-019-0437-4 (LYRA, TITAN, NANOINDENTER, HELIOS)

Yavas, H.; Fraile, A.; Huminiuc, T.; Sen, H. S.; Frutos, E.; Polcar, T., 2019: Deformation-Controlled Design of Metallic Nanocomposites. ACS APPLIED MATERIALS AND INTERFACES 11 (49), p. 46296 - 46302, doi: 10.1021/acsami.9b12235 (NANOINDENTER, TITAN, HELIOS)

Mouralova, K.; Benes, L.; Zahradnicek, R.; Bednar, J.; Hrabec, P.; Prokes, T.; Matousek, R.; Fiala, Z., 2018: Quality of surface and subsurface layers after WEDM aluminum alloy 7475-T7351 including analysis of TEM lamella. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY 99 (9-12), p. 2309 - 2326, doi: 10.1007/s00170-018-2626-1 (LYRA, ICON-SPM, HELIOS, TITAN, NANOINDENTER)

Details

Type of access
Full-service (paid), Self-service
Research area
Characterization
Category
Scanning probe microscopy
Subcategory
Nanoindentation
Guarantor
Gablech, Evelína
Site
CEITECNANO
Location
CEITEC Nano - C1.22