MIR spectroscopic ellipsometer J. A. Woollam IR-VASE
The spectroscopic ellipsometer covers the spectral range from 1.6 to 30 microns (333 to 6300 wavenumbers). The WOOLLAM-MIR offers non-contact measurements of many different material properties including thickness, optical constants, material composition, chemical bonding, doping concentration and more. Measurements do not require vacuum and can be used to study liquid/solid interfaces common in biological and chemical applications.
Specification
- Rotating compensator: incomplete Mueller matrix (11 components)
- Spectral range: 330–6300 1/cm (1.6–30 µm), for highly reflective samples 250–7700 1/cm (1.3–40 µm)
- Data Acquisition Rate: unit minutes to units hours per spectrum (depends on resolution and accuracy)
- Resolution: 1–64 1/cm
- Angle of incidence: 45°-90°
- Transmittance mode
- Vertical mounting
- Spot size: 10 mm (can be reduced)
Gallery
Publications
Mohelský, I.; Dubroka, A.; Wyzula, J.; Slobodeniuk, A.; Martinez, G.; Krupko, Y.; Piot, B. A.; Caha, O.; Humlíček, J.; Bauer, G.; Springholz, G.; Orlita, M., 2020: Landau level spectroscopy of Bi2Te3. PHYSICAL REVIEW B 102 (8), p. 085201-1 - 085201-11, doi: 10.1103/PhysRevB.102.085201 (WOOLLAM-MIR, FTIR)
Mohelský, I., 2020: Infrared magneto–spectroscopy of Bi2Te3 topological insulator. MASTER'S THESIS, p. 1 - 49 (FTIR, WOOLLAM-MIR, MAGNETRON, CRYOGENIC, KRATOS-XPS)
LIGMAJER, F.; HORÁK, M.; ŠIKOLA, T.; FOJTA, M.; DAŇHEL, A., 2019: Silver Amalgam Nanoparticles and Microparticles: A Novel Plasmonic Platform for Spectroelectrochemistry. JOURNAL OF PHYSICAL CHEMISTRY C (PRINT) 123 (27), p. 16957 - 8, doi: 10.1021/acs.jpcc.9b04124 (VERIOS, TITAN, FTIR, WOOLLAM-MIR)